Exhibitions:

ILA
at Berlin, Germany:
September 11 - 13, 2012

electronica
at Munich, Germany:
November 13 - 16, 2012

Start of construction: 
tecnotron will move
into a new building
in 2012.

tecnotron Neubau

Pulsonix:
new version 7.5

CAM350:
new version 10.7

BluePrint-PCB: 
new version 3.2

Our contribution to quality and environment
...

Area of competence

Equipment

  • Vötsch and CTS climatic exposure test cabinet
  • X-Tek CPX160 x-ray system
  • VISCOM AOI system
  • Spea 4040 flying probe
  • 2 x Dr. Eschke CT300 Meteor ICT universal test systems
  • Boundary scan (Göpel)
  • WEE W424 cable tester
  • Erfi TSI100 high voltage tester
  • Metallurgical polished specimen testing

Test procedures

  • Optical procedure: testing of the assembly optically or using x-ray analysis, automatically or manually.
  • Electronic processes: In-circuit test: testing of assemblies in their installed condition for operating values and correct functioning via a bed-of-nails tester or with a flying prober.
  • Boundary scan test: Digital test procedure according to IEEE1149.1 for assemblies with integrated components specially designed for the procedure
  • Functional testing

Test concepts with flying probe

  • Short circuit test
  • Connection test
  • Testing of resistances, condensers and diodes
  • Testing of bipolar transistors, field effect transistors and MOSFETS
  • Testing of open solder joints of, for example, BGAs via measurement of protective diodes at the component
  • Optionally, simple tests can be carried out, such as testing of the current consumption of an assembly

Mature testing concepts

AOI_System_Viscom

To achieve professional customer demands, the preconditions are high precision technical equipment and highly qualified employees in the testing department. tecnotron meets these demands by means of a comprehensive test equipment inventory and expert staff.

tecnotron offers three techniques for use in the testing of assemblies in an electronics production facility:

  • Structural tests
  • Functional tests
  • System tests

Mature test concepts as a part and parcel of the development process ensure the economic use of test equipment and high testing coverage.